Electrical Characterization

LID measured with flasher
© Fraunhofer CSP
The comparison of diffusion lengths of local charge carriers before and after light-induced degradation permits the classification of the particularly susceptible parts of a solar cell.

High efficiency and a long service life are two of the central demands placed on innovative photovoltaics products. Individual module components as well as complete modules must satisfy the highest standards. To obtain a quantitative evaluation, the Fraunhofer CSP applies innovative laboratory measurement methods applicable to solar cells and modules in combination with statistical data evaluation, model building and numeric simulation. In addition, a macroscopic assessment by means of spatially and spectrally resolved measurements is an essential element in our multiscale approach to identify the causes of defects, in which both macroscopic and microscopic fault patterns are associated with production-related performance parameters.

Services

  • Power evaluation and loss analysis of solar cells and modules
  • Spatially resolved and spectral measurement methods for defect localization
  • Development of new measurement methods and instruments for photovoltaics

Examples

Spatially Resolved Loss Analysis

LID test
© Fraunhofer CSP
The LID test reveals how degradation mechanisms impair the performance of solar cells and module components.

Spatially Resolved Loss Analysis of Cells and Mini Modules

A detailed loss analysis of solar cells and modules is of importance for quality control and process optimization purposes. Losses in the material, at the passivated layers or contact points, can be localized separately with a precision of several micrometers by applying methods of imaging and spectral resolution. This information can then be connected with the performance parameters, allowing for a rapid root-cause analysis and a significant acceleration of development processes.