Fraunhofer Center for Silicon Photovoltaics CSP
Fraunhofer Center for Silicon Photovoltaics CSP

Scientific Highlights Diagnostics and Metrology Solar Cells

 

© Fraunhofer CSP

Microstructural Analysis of the Cementation Process During Soiling on Glass Surfaces in Arid and Semi-arid Climates

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© Fraunhofer CSP

Root Causes of Defects on PERC Solar Cells

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© Fraunhofer CSP

New Insights into
Ultrathin Oxide Layers

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© Fraunhofer CSP

Rapid PV-Module
Component Testing and Quantification of
Performance Gains

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© LayTec

Precise LID Test for PERC Cells

PERC cells may lose performance due to LID. The LID Scope test device, developed by Fraunhofer CSP, determines the extent to which they are affected.

See Press Release
 

© © FH Südwestfalen/Bernd Ahrens

Advantages for Quality Control

Raman spectroscopy is intended to enable the analysis of impurities of silicon wafers in a non-destructive and non-contact manner.

See Press Release

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