Fraunhofer Center for Silicon Photovoltaics CSP
Correlative analysis of the back surface of a bifacial solar cell with PID defects
Roughness determination of Si wafers (Psa = 0.583 µm / PSq = 0.749 µm) by laser scanning microscopy.
Analysis of transparent layers: 3D reconstruction of an air bubble within a transparent multilayer system using laser scanning microscopy.
Depending on the application, the surface and interface properties of a material - whether separately or in a multilayer composite - significantly influence or support its functional properties. For example, in addition to the pure chemical composition of a layer, its structure or topography is also decisive.
We analyze and evaluate surface properties such as topography, wettability, optical and local chemical properties for our customers. If necessary, we can also use various analytical methods correlatively.